AZoM on MSN

Imaging silicon defects using Raman and PL multivariate imaging

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.
IEEE

Outlier Indicator Based Projection Fuzzy K-Means Clustering for Hyperspectral Image

Abstract: The application of hyperspectral image (HSI) clustering has become widely used in the field of remote sensing. Traditional fuzzy K-means clustering methods often struggle with HSI data due ...
IEEE

An Efficient Implementation of Small-Precision Floating-point Matrix Multiplication for AI-Based Image Processing Applications

Abstract: The Multiply and Accumulator (MAC) in Convolution Neural Network (CNN) for image applications demands an efficient matrix multiplier. This study presents an area- and power-efficient ...