PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.
A research team from The Hong Kong University of Science and Technology (HKUST) has developed GrainBot, an AI-enabled toolkit that automatically extracts and quantifies multiple microstructural ...
AI tools are frequently used in data visualization — this article describes how they can make data preparation more efficient ...
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