In order to maximize yield, IC design companies spend a lot of effort to analyze what types of design styles are needed and used in their layouts (standard cells, macros, routing layers, and so forth) ...

As integrated circuit (IC) designs have grown in complexity, scale and speed requirements, design rule checking (DRC) has evolved from a routine step into a critical pillar of successful tapeouts.

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Fractal analysis has emerged as a vital tool in understanding the inherent complexity and spatial dynamics of urban patterns and networks. By focusing on the properties of self-similarity and scale ...